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Personal Information
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Nationality: ITALIAN
Date of birth: 10 September 1981
Place of birth: ROME
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Work Experiences
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15th September 2009-
Space Engineering s.p.a.
Design and definition of test procedures UNCLA for Galileo program.
Design and definition in C # of Automatic Procedure for EGSE used in the payload acceptance test. The principal activities are: the knowledge of satellites architectures, the documentation of tests and test software, the skills of system integration, experiences of implementation and documentation of test sequences and test software/post-processing, knowledge of EGSE (Electrical Ground Support Equipment), experiences in the definition, implementation and maintenance of applications EGSE (test sequences, system procedures, ancillary applications) and databases. 6th April 2009- 15th September 2009
Altran Italia s.p.a.
Consultant (Technical Consultant)
Employed at the customer Thales Alenia Space in L'Aquila where I worked as Test Engineering in the field of space systems.
The principal activities were about the knowledge of the architectures of a satellite transmitters units, the documentation and implementation of tests.
8th January 2008- 06th April 2009
Altran Italia s.p.a.
Consultant (Junior Consultant/Technical Consultant)
Employed at the customer Thales Alenia Space in L'Aquila where I worked as Test Engineering in the field of space systems.
The principal activities were: the knowledge of the architecture of a satellite transmitter unit, the documentation of tests and testing activities.
November 2006- December 2007
Università degli studi di L’Aquila
PhD Student
First year of doctoral research focused on the study on Nanotechnology and implementation of nanoscale devices in collaboration with University of L'Aquila, Roma Tre and CNR (Italian National Council Of Research). From April 2006 to November 2006, I work as a collaborator in the University, starting the study about the growth techniques of nanowire and studying material’s properties in the nanoscale. I also started the implementation of an FPGA-based device for data acquisition and processing the outputs of nano-devices (low-noise amplifier, lock-in amplifier)
July 2003- September 2003
Micron Technology Italia s.r.l.
Trainee
I developed the topic of my bachelor degree in this company where I designed and implemented an automated system for the characterization of integrated circuits, studying in deep the CV (capacitance-voltage) characterization of MOS transistor.
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Education
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27th April 2006 Università degli Studi di L’Aquila
Laurea specialistica (Master Degree) in Electronic Engineer, Microelettronic, electronic circuits and systems
Title: CMOS IMAGE SENSORS: architectures and pre-characterization.
Topics: in this work I studied and simulated the architectures of image sensors in CMOS technology. I designed a system to derive the physical quantities of interest from sensor outputs and by processing data through a software written in Matlab.
Mark: 110/110 e lode
5th November 2003 Università degli Studi di L’Aquila
Laurea di primo livello (Bachelor Degree) in Electronic Engineer, Microelettronic, electronic circuits and systems
Title: Design and realization of an automatic measurement system for characterization of integrated circuits
Topics: during this work, developed at Micron Technology Italy, I design an automatic system for characterization of integrated circuits, the measures were taken directly on silicon wafers.
The main advantage in the development of the ATE was the significant reducing of measuring time and errors. Moreover it was possible to develop techniques for characterize these circuits with real-time measures.
In this experience I learned to compare with a team and understand how to work in a large industrial concern.
Mark: 110/110
1995-2000 Liceo Scientifico Statale di Avezzano “V. Pollione”
Diploma Esame di Stato (Secondary High School)
mark: 98/100
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Technical skills and competences
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Laboratory instrumentation basic and advanced (oscilloscopes, generators and voltage signal, multimeters, frequency meters, vector and scalar network analyzer, spectrum analyzer, logic state analyzer).
Use of optical and electronic microscopy (optical microscope, SEM, TEM) and SEM preparative samples.
Use of optical bench (lenses, mirrors, laser, monochromator, crystal, chopper, Optical Power Meter, prism, detector).
Using the main tool to design circuits (SPICE, LASI), the EM analysis tool (Microwave Office, CST), the automation tool for electronic instrumentation (LabView, CVI) and tools for programming and problem solving (Matlab , C, C# (for .NET application, but just beginner)).
Use of Optical Lithography, EBL (electron beam lithography), resist deposition and development, metallization, lift off, ion milling, dry and wet etch
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Trainings
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Language
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English (Level B2):
Understanding-listening and reading: Good
Speaking-Spoken Interaction and Spoken Production: Good
Writing: Good
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Computer skills and competences
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Microsoft Windows e Microsoft Office,
Matlab, P-Spice, Microwave Office, C, C#, LabVIEW, LASI
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Activities
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Pubblication
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V. Guaiani, F. Ciancetta, G. Bucci, M. Faccio, E. Palange
“From CMOS Image Sensor Output back to the evaluation of the device Quantum
Efficiency”, accepted for SSD2007, IEEE conference
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| 1 month - Discovery | 400 euros | convert |
| 3 months - Bronze | 1050 euros | convert |
| 6 months - Silver | 1800 euros | convert |
| 12 months - Gold | 2950 euros | convert |