Engineering Consultant to: ITT Space Systems Div. – Rochester, NY 1/2008 – Present
Principal Component Engineer

 Responsible for evaluation, selection and integrating components made by various members of the team to form the optical telescope element, which is the portion of the telescope that will collect light and provide sharp images of deep space from the James Webb Space Telescope (JWST) program

* EEE part procurement and screening documents per EEE-INST-002 and Aerospace Report No. TOR-2006(8583)-5236 (TOR - Technical Operating Report) for space programs

* Develop SCD’s on semiconductors and microcircuits per MIL-PRF-38534 and MIL-PRF-38535

* Developed screening requirements on  non-standard parts and submitted NSPAR’s for approval

 

Engineering Consultant to: General Dynamics Land Systems – Woodbridge, VA 10/2006 – 12/2007
Principal Reliability and Component Engineer

Complete responsibility for the parts count and parts stress reliability prediction/analysis on the Advanced Amphibious Assault Vehicle (AAAV) was officially renamed the Expeditionary Fighting Vehicle (EFV)

* Evaluation and Verification of electro-mechanical reliability predictions performed on the EFV per MIL-HDBK-217 and the Naval Surface Warfare Center NSWC-06 Physics of Failure (POF) Model for Mechanical Equipment. Also prepared Reliability Block Diagrams (RBD)

* Evaluation of field failures and developing statistical analysis using the Crow Model and Reliability Growth Modeling using RGA-6 from ReliaSoft per MIL-HDBK-189 and 781

* Assisted with mechanical and thermal stress testing analysis and evaluation performed to determine  over-stressed components using XRD and SEM analysis

* Evaluation of electrochemical and mechanical effects, such as corrosive wear and erosive corrosion, from lab testing and failure investigations, to simulation studies

* Materials characterization, materials testing, characterization of composites, corrosion engineering analysis using transmission electron microscopy (TEM), scanning electron microscopy (SEM), X-ray diffractometry (XRD), energy dispersive X-ray spectroscopy (EDX), optical spectrometry

 

  Engineering Consultant to: NASA – MSFC/NASA Huntsville, AL 1/2006 – 9/2006
  Principal Reliability and Maintainability Engineer

* Assigned to an Upper-Stage Team Lead and working with other NASA engineers and scientists to evaluate and develop the Reliability and Maintainability requirements needed on the Constellation Launch Vehicle (CLV) 

* Evaluate reliability parts count and parts stress predictions per MIL-HDBK-217, IEC TR 62380 (formerly RDF 2000), NSWC06/LE10 using RELEX Reliability Analyses, Failure Modes Effects Analyses/Critical Items Lists (FMEA/CIL) development per MIL-STD-1629, and/or Maintainability & Supportability analysis on complete system

 

 

 Quantum Technologies, Inc. - Fort Walton Beach, FL 2/1995 – 12/2005
Reliability and Component Engineering Senior Manager

Complete structure and setup of the reliability and component engineering departments including the responsibility of screening and hiring all key individuals to cover all engineering efforts and support functions. Managed 18 engineers and technicians on various military, aerospace and NASA space projects to ensure success on all programs

* Established reliability testing methods for product development, manufacturing acceptance and reliability assurance. Development and improvement of reliability programs, including reliability testing, data analysis methods, product validation, product failure analysis and ISO 9001/2000

* Extensive experience in reliability analysis and RAM-T testing methods (HALT, HASS, ESS, RGT, demonstration, accelerated life testing), Thermal Profiling, and Probability Ratio Sequential Testing (PRST), RAM-T and data analyses and system analysis using MIL-STD-2164, DOD-HDBK-344 - ESS, MIL-STD-756 – Reliability Modeling, MIL-STD-781 – Reliability Design Qualification and Production Acceptance Tests: Exponential/ Distribution, MIL-HDBK-781 - Reliability Test Methods, Plans and Environments for Engineering Development, Qualification and Production and MIL-HDBK-338 - Electronic Reliability Design Handbook

* Define component and material requirements that meet manufacturing, application and reliability requirements

* Involved in all phases of reliability program implementation, from initial guidance and training of senior management, to application of Failure Analyses (FMEA, FMECA, FRACAS, WCCA, and FTA)

* Developed advanced testing methods for reliability testing on fiber-optic and optoelectronic components and systems to meet Telcordia (Bellcore) standards using “Physics of Reliability Techniques”

*  Performed IC device reliability testing ranging from preproduction evaluation, defining qualification plans, executing product/process qualifications, assessing new technologies. Established reliability test plans on new process/package/design and ongoing reliability monitoring

* Manufacturing processes, semiconductor material, fab processes, IC packaging, IC failure analysis, and device reliability stress testing at device level and product level and chemistry of GaAs, III-V, and solid state/semiconductor device physics

* Developed detailed component procurement specifications, Generates plans, procedures, EEE part procurement and screening documents per EEE-INST-001 and 311-INST-001 (SCD's, SoCD;s, SID's, and AID's) with broad knowledge of Commercial-off-the-Shelf (COTS) parts on microcircuits, semiconductors, RF, microwave, and fiber optic components in accordance with MIL-STD-19500, MIL-STD-38510, MIL-PRF-38534, MIL-PRF-38535 and other applicable military documents.

* Experience in Quality Assurance, EMC/EMI/RFI engineering, failure analysis techniques and applying quality and reliability methodologies such as TQM, SPC, RGM (Reliability Growth Monitoring) per MIL-HDBK-189 and Six Sigma Management techniques

 

Under Contract to: Applied Physics Laboratory (APL) - Laurel, MD  2/1994 – 6/1995
Sr. Component/Reliability Engineer

* Developed and maintained the APL and AVL on the Near Earth Asteroid Rendezvous (NEAR) program

* Review and selection of “S” level Rad-Hard components for space applications

* Performed parts count and parts stress reliability predictions to meet program requirements

 

 

Under Contract to: NASA/Jet Propulsion Laboratory (JPL) - Pasadena, CA  1/1992 – 1/1994
Sr. Parts/Component Engineer

 As a member of the Parts Engineering Group working on various projects such as “Deep Space 1 (DS1)” Ion Propulsion engine program worth $149.7M

* Evaluation for electrical and mechanical stress and reliability analysis by performing environmental and reliability testing. Responsible for screening, evaluating and selection of all electrical, electronic, electromechanical, components and materials used in the design

 

Transportation Technology Center – Pueblo, CO  2/1988 – 1/1992
 Reliability/Component Engineering Manager

* Failure Analysis/Reliability Analysis and assessment responsibilities on advance research projects

* Managed a team of 13 engineers and technicians in the Reliability, Maintainability and Component Engineering groups including the management and responsibilities of the Failure Analysis Laboratory

 

Under Contract to: Naval Ocean Systems Center (NOSC) - San Diego, CA  2/1986 – 12/1987
Research Associate/Program Manager

* Project manager and reliability analysis responsibilities on the Navy’s “Relocatable Over The Horizon Radar”  (ROTHR) Project

* Researched and prepared scientific paper "Seawater Plasma Sound Source (Confidential)" NOSC internal report, April 1986

* Higgins, R.L., and McManus, B., "Statistical Analysis of Clark Lake Radio Observatory Ionospheric Structure Measurements” NOSC Technical Document #TD-1090, May 1987

* As a member of the R&D organization we performed experimental research to develop a underwater transducer for long range telecommunications

Education 

Doctor of Philosophy in Physics from Colorado State University  
Theoretical/Experimental Condensed Matter Physics
Dissertation: “Design and passivation of thin-film Polycrystalline Solar Cells using CdTe, CuInSe2”

Master of Business Administration from University of Phoenix 
Area of concentration: Technology Management

Master of Science in Physics from Colorado State University  
Concentration in Applied/Theoretical Solid State Semiconductor Physics and Engineering Physics
Graduated with highest distinction
Thesis: “Mathematical Modeling of thin-film Polycrystalline Solar Cells using CdTe, CuInSe2”

Bachelor of Science in Physics from Colorado State University  
Minor in Chemistry with concentrations in Solid State Semiconductors Physics, Engineering Physics
Graduated Summa Cum Laude

Bachelor of Science in Applied Mathematics from Colorado State University   
Concentration in Applied and Computational Statistics

 

Professional Licenses & Certifications                                  

* Registered Professional Chartered Scientist (CSci), by The Science Council

* Registered Professional Chartered Physicist (CPhys), by Institute of Physics (IoP)

* Registered Professional European Physicist (EurPhys), by European Physical Society (EPS)

* Registered Professional Engineer (PE), by National Society of Professional Engineers (NSPE)

* Certified Reliability Engineer, (CRE) by American Society of Quality (ASQ)

* Certified Quality Control Engineer, (CQE) by American Society of Quality (ASQ)

* Certified Quality Manager, (CQM) by American Society of Quality (ASQ)

* Certified Electrostatic Discharge Control Engineer, by NARTE

* Certified Electromagnetic Compatibility Engineer, by NARTE

Scientific Publications  

                                                

 

I. R. Higgins, “Better Testing Improves Component Reliability”, Photonics Spectra Magazine, August 2001, p. 135 – 137

II. R. Higgins, “High Temperature Conductance of the Single Electron Transistor” Applied Physics Laboratory 1995

III. R. Higgins, “Quantum Measurements Performed with a Single-Electron Transistor” Applied Physics Laboratory, 1995

IV. R. Higgins, “A Physics-of-Failure Approach to Accelerated Life Testing of Electronic Equipment”, Reliability and Engineering Branch Publication, NASA, 1994 

V. R. Higgins, “Electronic Properties of Coherently Strained Semiconductors”, Journal of Semiconductor Physics, 1999, European Physical Society, p. 84 - 92.

VI. R. Higgins, W. Vigrass, “Calculation of Semiconductor Failure Rates”, Harris Semiconductor , 1998

VII. R. Higgins, J. Sites, “Device Physics Of Thin-Film Polycrystalline Cells And Modules” Colorado State University

VIII. R. Higgins, J. Sites,  “Current-Voltage Characteristics of Polymer Light-Emitting Diodes” Colorado State University

Professional Training                

                                  
* Software Reliability and Integrity, by Reliability Analysis Center (RAC) - 2007
* System Software Reliability Training Course, by Reliability Analysis Center (RAC) - 2005
* Reliability Engineering for Managers, by ReliaSoft Corporation - 2004
* Design of Experiments Executive Overview, by ASQ – 2004
* Design and Process FMEA/FMECA, by Quality Associates International - 2003
* Electronic Design Reliability Training Course, by Reliability Analysis Center (RAC) - 2003
* Applied Reliability Analysis for Semi-conductor and Electronic Devices, by Dr. Hugh W. Broome – 2001
* Design for Reliability, by Reliability Analysis Center (RAC) – 2000

Technical Skills

* Mathematical modeling analyst, reliability allocations, fault modeling, algorithm development, test generation algorithms, fault simulation, functional testing, design for testability and built-in self-test (BIT)

* Developed and administered reliability environmental testing on fiber-optic components per GR-20, GR-63, GR-357, GR-468, GR-1221, GR-1209, GR-2912, SR-332, SR-TSY-001171, MIL-STD-883, NEBS Level 111 testing methods and reliability MTBF/MTTR/FIT predictions and allocations in accordance with MIL-HDBK-217, IEC TR 62380 (formerly RDF 2000), GJB/Z 299B, NSWC06/LE10, HRD5 and CNET 93

* Familiar with and have used most safety standards including European Regulations for semiconductor industries SEMI S2-93A, "Safety Guidelines for Semiconductor Manufacturing Equipment," and SEMI S8-95 "Safety Guidelines for Ergonomics/Human Factors Engineering of Semiconductor Manufacturing Equipment"

* Advanced knowledge of electro-optical, optoelectronic, high frequency fiber-optic and photonic devices, analog/digital electronic components, MEMS, GaAs, III-V, Device Physics, RF and microwave active/passive SMT devices and experience with optical power meters/detectors/spectrum analyzers, optical performance testing of WDMs, DWDMs, switches, waveguides, polarization components and tap couplers

* Extensive knowledge of active/passive electronic components, RF, MEMS, microwave, optoelectronic, photonic and fiber-optic components, electro-mechanical and mechanical components including a working understanding of the technologies, processes, and inter-relationships of semiconductors, passive components, optical components, ASICs, PWB’s, Materials/Processes, and other critical-to-success components.

* Developed and administered ESS/HALT/HASS testing programs on electronic systems; for salt spray, humidity, vibration, shock, etc. on RF to high frequency devices in accordance with MIL-STD-202, MIL-STD-750, MIL-STD-810 and MIL-STD-883 reliability level “S”. Thermal Profiling, and Probability Ratio Sequential Testing (PRST) per MIL-HDBK 781.

* Evaluate and test EMC/EMI/RFI/ESD shielding & grounding techniques used on airborne, ground mobile, aerospace and electronic test equipment/subsystems and implemented HERF (High Energy Radiated Field) testing in accordance with MIL-STD-461, -462, -469, -1686 and MIL-HDBK-237

* Familiarization and have used most software packages such as Word Perfect, MS Office, Word, Excel, Power Point, Access, Project, AutoCAD, Maple, Relex, ReliaSoft’s ALTA 6, RGA 6, Lamda Predict and Weibull ++, QuART Pro, LabVIEW, MathType MathWorks, MathLab, Mathematica, and MathCAD Professional, Table Curve, Minitab, and STATGRAPHIES Plus, Remedy

* Coordinated design and start-up of a Failure Analysis Laboratory and Environmental Testing Laboratory, including lab equipment layout, space utilization, ordering, installation, and purchase of scientific/engineering test equipment, within allotted budget. Established and implemented operations and lab test procedures

* Familiar with and have used reliability techniques such as Weibull analysis, Monte Carlo analysis, Crow Discrete Reliability Growth Model, Duane Model, Bayes Theorem, Markov Model, Worst Case Circuit analysis, Fault-Tree analysis, component and system level Root Cause Failure Analysis, identifying failure mechanism and implementing corrective action, FMEA, FMECA, derating/stress techniques using AS-4613, MIL-HDBK-1547, MIL-STD-975 and TE000-AB-GTP-010 to develop and analyze reliable products

* Extensive knowledge in engineering and scientific fields of Optoelectronics, Fiber-Optics, Statistics, Mathematics, System Analyst, Component Engineering, Software Reliability, Reliability and Maintainability Engineering, Quality Assurance, Test Engineering, Environmental Testing, Component Failure Analysis, Mathematical/Statistical Analysis, Algorithm Development, and Applied/Theoretical Solid State Physics

* Designed and developed reliability tests and performed reliability predictions on DC/DC power modules and UPS (Uninterruptible Power Systems) from 10 – 30 KVA systems including the design of test fixtures

* Knowledge and have used most ANSI, CSA, EMC, EIA, UL, CE, TUV, MIL, NASA, DoD, JEDEC, Telcordia (Bellcore), ISO9000/9001, TL9000, NAV and international regulatory/compliance standards

* Extensive knowledge of active/passive and SMT electronic components including strip-line circuit designs, manufacturing processes, chemistry and semiconductor device physics

* Developed the most effective method for selection, parts screening for various high reliability part programs. Developed procedures, EEE part procurement and screening documents (SCD's, SoCD;s, SID's, and AID's)