Personal information

Nationality

Italian

Date of birth

14^th November 1976

Work experience

• Dates (from – to)

January 2008 - Now

• Name and address of employer

Altra Italia S.p.A.

• Type of business or sector

Consulting firm in Aerospace, Defense, Automotive and IT fields

• Occupation or position held

Consultant as Microwave Designer at Thales Alenia Space, Rome, Italy

• Main activities and responsibilities

·         Research on wide bandgap semiconductor technology, focusing on wide-band and high-power devices based on Gallium Nitride (GaN). The research activity ended with a survey written in English on the state of the art of GaN technology.

·         GaAs HPAs and GaN LNAs measurement (S Parameters, Noise Figure, Power Sweep, IP3).

·         Design of hybrid structures (with both EM and circuit analysis) for microwave and mm-wave power application.

• Dates (from – to)

April – December 2007

• Name and address of employer

Thales Alenia Space, Rome, Italy

• Type of business or sector

Aerospace

• Occupation or position held

RF & Microwave Engineer - Internship

• Main activities and responsibilities

·         Design of Test Jigs for MMICs measurements.

·         Design of microstrip power dividers/couplers (with both EM and circuit analysis)  in Alumina and LTCC technology for HPAs coupling up to 40 GHz.

·         Design of transitions between different technologies: Microstrip-Waveguide, Microstrip-CWG, Coaxial-Waveguide.

·         Research on HPAs coupling in Waveguide technology (Waveguide Tray Amplifiers).

Education and training

• Dates (from – to)

August 2006 – February 2007

• Name and type of organisation providing education and training

NTI Europe, European Headquarters of NT-MDT,  Apeldoorn, Netherlands – MSc’s Internship

• Principal subjects/occupational

skills covered

·         Several Scanning Probe Microscopy (SPM) techniques were studied and applied to different kinds of samples.  Conductors, Semiconductors, Magnetic samples, Polymers and Carbon Nanotubes (embedded and on the sample surface) were investigated by means of the most common techniques: STM (Scanning Tunnelling Microscopy), AFM (Atomic Force Microscopy), MFM (Magnetic Force Microscopy), AFAM (Atomic Force Acoustic Microscopy), AFUHM (Atomic Force Ultrasound Holography Microscopy) and LON (Local Oxidation Nanolithography). Also a new technique, Piezoresponse Force Microscopy (PFM), were successfully used in the characterization and modification of ferroelectric surfaces at the micro- and nano-meter scale.

·         Cooperation in Spin + , a project carried out together with Eindhoven and Delft Universities for developing a device capable to analyze polymers crystallization by means of SPM microscopes. My task was to design and realize an electronic interface to control by PC the stage on which the polymer sample is crystallized.

• Dates (from – to)

January – July 2006  

• Name and type of organization providing education and training

International Master in Nanotechnologies (IMN MSc) –

CIVEN (Association of Veneto Universities), Venice, Italy

• Principal subjects/occupational

skills covered

A joint course of Universities of Padua, Venice and Verona offering a top quality managerial programme for next generation managers, entrepreneurs and consultants in the field of nanotechnologies applied to business.

Main scientific subjects: properties of materials, microstructural and microanalytical analysis techniques, surface characterization, spectroscopy, nanofluidics, nanotribology, nanoparticles, thin films and carbon nanotubes.

Main non-scientific subjects: corporate financing, business planning, entrepreneurship, leadership, intellectual property protection.

Thesis title: ” Advanced SPM Techniques in Nanotechnology”

The work has been carried out during the internship in NTI-Europe and is a complete guide for Scanning Probe Microscopy, based on the personal experience in the company labs.

• Title of qualification awarded

MSc in Nanotechnology

• Dates (from – to)

December 2005

• Name and type of organization providing education and training

University of Messina

• Title of qualification awarded

Engineer Qualifying Examination

• Level in national classification

(if appropriate)

Final Grade: 90%

• Dates (from – to)

January 1998– November 2005 

• Name and type of organization providing education and training

Electronics Engineering faculty, University of Messina

• Principal subjects/occupational

skills covered

Thesis title: “Determination of non-linear HEMT models at microwave frequencies: scalability properties and temperature dependencies”.

Effective HEMT (High Electron Mobility Transistor) models were developed by software (AWR Microwave Office) in order to simulate a family of HEMTs and match the S-parameters measured at different temperatures and working points.

• Title of qualification awarded

Master of Electronics Engineering

• Level in national classification

(if appropriate)

Final Grade: 90%