Latest Space News
Fri, 22 Jun 2018 22:07:52 +0000
Nearly a month after the signing of a policy directive calling for commercial space regulatory reforms, Commerce Department officials said this week they’re moving ahead on a number of fronts. SpaceNews.com
Fri, 22 Jun 2018 03:12:12 +0000
The White House has directed NASA to study the possibility of converting one of more of its field centers into federal labs, revisiting a proposal made nearly 15 years ago. SpaceNews.com
Fri, 22 Jun 2018 00:04:04 +0000
The Falcon Heavy beat United Launch Alliance’s Delta 4 in a competition under the Evolved Expendable Launch Vehicle program. SpaceNews.com
Thu, 21 Jun 2018 23:41:21 +0000
To receive FIRST UP Satcom, a weekly SpaceNews newsletter for satellite and telecom professionals, sign up here. TOP STORIES Chinese hackers tried to gain control of U.S. satellites in late 2017, leading a cyber firm to notify the U.S. government. Symantec’s protection software blocked some of the tools used by attackers known as “Thrip” that attacked two […] SpaceNews.com
Thu, 21 Jun 2018 22:56:40 +0000
Blue Origin expects to start flying people on its New Shepard suborbital vehicle “soon” and start selling tickets for commercial flights next year, a company executive said June 19. SpaceNews.com
Thu, 21 Jun 2018 21:41:59 +0000
Canadian satellite antenna manufacturer C-Com said June 21 it successfully tested the building blocks of a phased array antenna it hopes to sell next year. SpaceNews.com
Thu, 21 Jun 2018 15:25:18 +0000
Rogers: Whether you call the new branch a Space Corps or a Space Force is not all that important. SpaceNews.com
Thu, 21 Jun 2018 10:45:26 +0000
A report released by the White House June 20 outlines a set of goals to address the small but “high-consequence” threat posed by near Earth objects (NEOs), but does not commit to spending more money to achieve them. SpaceNews.com
Wed, 20 Jun 2018 19:52:56 +0000
Former Air Force Secretary Deborah Lee James: "The Air Force and the DoD have to come up with something to back up what the president said.” SpaceNews.com
Wed, 20 Jun 2018 15:57:18 +0000
China has lowered the orbit of its Tiangong-2 space lab, likely in preparation for deorbiting the orbital facility and thus averting a similar scenario to the uncontrolled re-entry of Tiangong-1 earlier this year. SpaceNews.com
Wed, 20 Jun 2018 12:13:10 +0000
Those who loathe or love a Space Force “separate but equal” to the Air Force must think and act decisively and quickly. Regardless of whether the Space Force actually materializes, deliberation alone could finally spring us into action to deal with the looming threat of space Pearl Harbor. SpaceNews.com
Wed, 20 Jun 2018 11:12:05 +0000
An advisory group dubbed the “think tank” for the National Space Council formally kicked off its work June 19 with a broad but vague mandate to study space policy issues. SpaceNews.com
Wed, 20 Jun 2018 00:08:21 +0000
Fleet operators SES and Intelsat asked the U.S. Federal Communications Commission to extend the deadline for their customers to register C-band dishes before the commission decides on the band’s future use. SpaceNews.com
Tue, 19 Jun 2018 11:00:08 +0000
Trump’s proposal derives from a growing debate inside military and political circles about how to best meet the threat posed to American space assets by potential enemies: Russia and China, to be precise. SpaceNews.com
Tue, 19 Jun 2018 01:45:44 +0000
A former NASA astronaut used an appearance at a National Space Council meeting June 18 to argue that a key element of NASA’s plans to return humans to the moon should be reconsidered. SpaceNews.com
Mon, 18 Jun 2018 19:35:34 +0000
Trump: Creating a Space Force and promoting space exploration by NASA and the private sector will be “important for the nation’s psyche.” SpaceNews.com
Mon, 18 Jun 2018 13:22:16 +0000
President Trump will sign a new space policy directive June 18 addressing space traffic management issues, closely following the proposed policy that Vice President Pence announced in April. SpaceNews.com
Mon, 18 Jun 2018 08:45:21 +0000
A key senator says he’s keeping an open mind regarding who in the federal government should have responsibility for the oversight of “non-traditional” commercial space activities. SpaceNews.com
Sat, 16 Jun 2018 19:45:35 +0000
The House Appropriations defense subcommittee approved $49.5 million to create a new “program of record for commercial satellite communications." SpaceNews.com
Fri, 15 Jun 2018 20:23:14 +0000
As the National Space Council prepares for its third public meeting, its activities to date have won widespread praise in the space community, even as there is some skepticism about the effectiveness of the council’s advisory group that will soon meet for the first time. SpaceNews.com
More space news...
18657 cvs - 800 jobs

LOOKING FOR A JOB?

  • HOME
  • POST YOUR CV
  • JOB SEARCH
  • LOOKING FOR STAFF?

  • HOME
  • REGISTER
  • CV SEARCH
  • POST JOBS
  • CV: PhD student

    Printer Friendly


    << BACK

    Personal information
     Name:<withheld>
     Age:<withheld>
     Country:<withheld>
     Location:<withheld>
    Contact information
     Email:<withheld>
     Phone:<withheld>
     Mobile:<withheld>
    Candidate Profile
     Date Submitted:09-06-2009
     Last Modified:09-06-2009 (12:38)
    Job information
     Current job:PhD student
     Employment Term:Permanent
     Job location:Anywhere
     Date available:
     Industry:Civil Agencies/International Organizations, Satellite Manufacturers and Subcontractors, Satellite Operators, , , Consulting/Engineering Services
     Keywordsreliability and ESD on advanced CMOS technologies
    CV
    CURRICULUM VITAE
     
    PERSONAL DETAILS
    Date and place of birth:      Mirano, Venice, Italy, March 9, 1982
    Nationality:                          Italian
    Marital Status:                     Single
     
    EDUCATION AND QUALIFICATIONS
    January 2007 – February 2010 (expected)             
                                            Ph.D. student at the Department of Information Engineering (DEI), University of              Padova, Padova, Italy.
                                            Supervisor: Prof. G. Meneghesso.
    January 2008 – May 2009         
                                            Guest Ph.D. student at the Interuniversity Microelectronics Center (IMEC), Leuven,        Belgium, working on the ESD design and characterization of multi-gate FinFET       devices.
                                            Supervisor: Prof. G. Groeseneken.
    July 3, 2006                    “Laurea” degree (equivalent to M.S. degree) summa cum laude in Electronic      Engineering, major Microelectronics, received from the University of Padova,               Padova, Italy.
                                    Title of the thesis: “Reliability of Fully Depleted SOI MOSFETs with Ultra-Thin                Gate Oxide in 65-nm CMOS Technology”.
    September 15, 2004      B.S. degree in Information Engineering received from the University of Padova,                Padova, Italy.
                                    Title of the thesis: “Stochastic Differential Equations”.
    July 2001                        High-school degree as aeronautic expert with a score of 100/100 after 5 years of high-     school courses from the “I.T.I.S. G. Natta” School of Padova, Italy.
     
    RESEARCH INTERESTS
    Electrostatic discharge (ESD) and ionizing radiation effects on advanced CMOS devices.
    ESD                                ESD design and characterization of FinFET devices in both bulk and SOI substrate          technologies and planar fully depleted SOI MOSFETs with ultra-thin silicon body.
    Radiation effects          Microdose effects induced by heavy-ion strikes in planar fully depleted SOI      MOSFETs and SOI FinFET devices and dose enhancement due to interconnects in     deep-submicron MOSFETs exposed to X-rays.
     
    COLLABORATION WITH INDUSTRIES AND RESEARCH CENTERS
    2006 - 2009                     Collaborating with:
    1.        Microelectronics Group of DEI, University of Padova, Padova Italy
    2.        IMEC,  Leuven, Belgium
    3.        Laboratori Nazionali di Legnaro (LNL) of the Istituto Nazionale di Fisica Nucleare (INFN), Padova, Italy.
    4.        Infineon, Munich, Germany.
     
    LANGUAGES SKILLS
    • Italian: mother tongue.
    • English: good. I passed the GRE – General Test and the Trinity testes in 2006 and 2001, respectively.
     
    EXPERIMENTAL SKILLS
    • Optimum knowledge and manual skill of the Transmission Line Pulse (TLP), Human Body Model (HBM), and very fast Transmission Line Pulse (vfTLP) ESD stress systems.
    • Optimum knowledge and manual skill of the heavy-ion beam, X-rays, and g-rays radiation facilities.
     
    COMPUTER SKILLS
    • Good knowledge of P-Spice, H-Spice, Mathlab, MathCad, and Office.
    • Discrete knowledge of Cadence, Python, Java, and Sun and Linux operating systems.
    • Basic knowledge of DESSIS, Sentaurus, and TSUPREM TCAD simulators and LabView.
     
    OTHER SKILLS
    • Optimum knowledge of transistor reliability, advanced transistor characterization techniques, reliability modeling, analog and digital circuit reliability and device physics.
    • I consider myself to be self-directed, pro-active and innovative and to have optimum communication skills and self organization.
    • I consider myself open to learn and investigate new exciting topics.
     
    OTHER
    IEEE student member and member of IEEE Electron Devices Society, IEEE Reliability Society, IEEE Nuclear and Plasma Sciences Society, and ESD Association.
     
    REFERENCES
    References are available on request.
     
    PUBLICATIONS
    International journal papers
    [1]        S. Thijs, D. Trémouilles, C. Russ, A. Griffoni, N. Collaert, R. Rooyackers, D. Linten, M. Scholz, C. Duvvury, H. Gossner, M. Jurczak, and G. Groeseneken, “Characterization and Optimization of Sub-32nm FinFET Devices for ESD Applications”, IEEE Transaction on Electron Devices, vol. 55, no. 12, pp. 3507-3516, December 2008.
    [2]        A. Griffoni, S. Gerardin, G. Meneghesso, A. Paccagnella, E. Simoen, S. Put, and C. Claeys, “Microdose and Breakdown Effects Induced by Heavy Ions on sub 32-nm Triple-Gate SOI FETs”, Transaction on Nuclear Science, vol. 55, no.6, pp. 3182-3188, December 2008.
    [3]        A. Griffoni, M. Silvestri, S. Gerardin, G. Meneghesso, A. Paccagnella, B. Kaczer, M. de Potter de ten Broeck, R. Verbeeck, and A. Nackaerts, “Dose Enhancement due to Interconnects in Deep-Submicron MOSFETs Exposed to X-Rays”, in press in IEEE Transaction on Nuclear Science.
    [4]        A. Griffoni, S. Gerardin, A. Cester, A. Paccagnella, E. Simoen, and C. ClaeysEffects of Heavy-Ion Strikes on Fully Depleted SOI MOSFETs with Ultra-Thin Gate Oxide and Different Strain-Inducing Techniques”, IEEE Transaction on Nuclear Science, vol. 54, no. 6, pp. 2257-2263, December 2007.,
    [5]        S. Gerardin, A. Griffoni, A. Tazzoli, A. Cester, G. Meneghesso, and A. Paccagnella, “Electrostatic Discharge Effects in Irradiated Fully Depleted SOI MOSFETs with Ultra-Thin Gate Oxide”, IEEE Transaction on Nuclear Science, vol. 54, no. 6, pp. 2204-2209, December 2007.
    [6]        S. Gerardin, A. Griffoni, A. Cester, A. Paccagnella, G. Ghidini, “Degradation of Static and Dynamic Behavior of CMOS Inverters during Constant and Pulsed Voltage Stress”, Microelectronics Reliability, vol. 46, no 9-11, pp. 1669-1672, Sept. – Nov. 2006.
    International conference papers
    [7]        A. Griffoni, S. Thijs, C. Russ, D. Trémouilles, M. Scholz, D. Linten, N. Collaert, R. Rooyackers, C. Duvvury, H. Gossner, G. Meneghesso, and G. Groeseneken, “Impact of Strain on ESD Robustness of FinFET Devices”, 2008 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, pp. 341-344, December 15-17, 2008.
    [8]           A. Griffoni, A. Tazzoli, S. Gerardin, E. Simoen, C. Claeys, and G. Meneghesso, “Electrostatic Discharge Effects in Fully Depleted SOI MOSFETs with Ultra-Thin Gate Oxide and Different Strain-Inducing Techniques”, 2008 Electrical Overstress / Electrostatic Discharge Symposium, Tucson, AZ, USA, pp. 59-66, September 7-12, 2008.
    [9]        S. Thijs, C. Russ, D. Trémouilles, A. Griffoni, D. Linten, M. Scholz, N. Collaert, R. Rooyackers, M. Jurczak, M. Sawada, T. Nakaei, T. Hasebe, C. Duvvury, H. Gossner, and G. Groeseneken, “Design Methodology of FinFET Devices that Meet IC-Level HBM ESD Targets”, 2008 Electrical Overstress / Electrostatic Discharge Symposium, Tucson, AZ, USA, pp- 295-303, September 7-12, 2008.
    [10]    A. Griffoni, A. Tazzoli, S. Gerardin, G. Meneghesso, E. Simoen, and C. Claeys, “ESD Sensitivity of 65-nm Fully Depleted SOI MOSFETs With Different Strain-Inducing Techniques”, 2008 International ESD Workshop, Domaine de Pinsolle, Port D’Albret – France, May 12-15, 2008.
    [11]    A. Griffoni, M. Silvestri, S. Gerardin, G. Meneghesso, A. Paccagnella, B. Kaczer, M. de Potter de ten Broeck, R. Verbeeck, and A. Nackaerts, “Dose Enhancement due to Interconnects in Deep-Submicron MOSFETs Exposed to X-Rays”, 8th European Workshop on Radiation Effects on Components and Systems, Jyväskylä, Finland, September 10-12, 2008.
    [12]    A. Griffoni, S. Gerardin, G. Meneghesso, A. Paccagnella, E. Simoen, S. Put, and C. Claeys, “Microdose and Breakdown Effects Induced by Heavy Ions on sub 20-nm Triple-Gate SOI FETs”, 45th IEEE - Nuclear and Space Radiation Effects Conference - NSREC 2008, Tucson, AZ, USA, July 14-18, 2008.
    [13]    A. Griffoni, G. Meneghesso, and A. Paccagnella, “Ionizing Radiation Effects on Advanced CMOS Devices and on ESD Protection Structures for CMOS Technology”, RADFAC 2008, Mol - Belgium, March 19, 2008.
    [14]    A. Griffoni, E. Simoen, N. Collaert, C. Claeys, A. Paccagnella, and G. Meneghesso, “Multi-Gate Devices for the 32-nm Node and Beyond: Advantages and Issues”, 17th European Heterostructure Technology Workshop - HETECH 2008, Venice, Italy, November 2-5, 2008.
    [15]    A. Griffoni, S. Gerardin, A. Cester, A. Paccagnella, E. Simoen, and C. Claeys, “Effects of Heavy-Ion Strikes on 65-nm Fully Depleted SOI MOSFETs with Strain-Inducing Techniques: New and Old Concerns”,44th Nuclear and Space Radiation Effects Conference - NSREC 2007, Honolulu, Hawaii, USA, July 23-27, 2007.
    [16]    S. Gerardin, A. Cester, A. Tazzoli, A. Griffoni, G. Meneghesso, and A. Paccagnella, “Electrostatic Discharge Effects in Irradiated Fully Depleted SOI MOSFETs with Ultra-Thin Gate Oxide”, 44th Nuclear and Space Radiation Effects Conference - NSREC 2007, Honolulu, Hawaii, USA, July 23-27, 2007.
    [17]    S. Gerardin, A. Griffoni, A. Degradation of Static and Dynamic Behavior of CMOS Inverters during Constant and Pulsed Voltage Stress”,  17th European Symposium Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2006), Wuppertal - Germany, October 3-6, 2006.Cester, A. Paccagnella, G. Ghidini, “
    Italian journal papers
    [18]    S. Gerardin, A. Griffoni, A. Tazzoli, G. Meneghesso, and A. Paccagnella, “Electrostatic Discharge Sensitivity of Fully Depleted SOI MOSFETs Struck by Heavy Ions”, LNL Annual Report 2007, pp. 87-88, 2008.
    [19]    A. Griffoni, S. Gerardin, A. Paccagnella, E. Simoen, and C. Claeys, “Effects of Heavy-Ion Strikes on 65-nm Fully Depleted SOI MOSFETs: New and Old Concerns”, LNL Annual Report 2007, pp. 85-86, 2008.
    Papers to be presented
    [20]    A. Griffoni, S. Thijs, C. Russ, D. Trémouilles, D. Linten, M. Scholz, N. Collaert, L. Witters, G. Meneghesso, and G. Groeseneken, “Next Generation Bulk FinFET Devices and Their Benefits for ESD Robustness”, 2009 Electrical Overstress / Electrostatic Discharge Symposium.
    [21]    S. Thijs, D. Trémouilles, A. Griffoni, C. Russ, D. Linten, M. Scholz, C. Duvvury, and G. Groeseneken, “Electrical and Thermal Scaling Trends for FinFET ESD Design”, 2009 Electrical Overstress / Electrostatic Discharge Symposium.
    [22]    S. Thijs, K. Raczkowski, D. Linten, M. Scholz, A. Griffoni, and G. Groeseneken, “CDM and HBM Analysis of ESD Protected 60 GHz Power Amplifier in 45 nm Low-Power Digital CMOS”, 2009 Electrical Overstress / Electrostatic Discharge Symposium.
    [23]    D. Linten, P. Roussel, M. Scholz, S. Thijs, A. Griffoni, M. Sawada, T. Hasebe, and G. Groeseneken, “Calibration of Very Fast TLP Transients”, 2009 Electrical Overstress / Electrostatic Discharge Symposium.
    [24]    A. Griffoni, S. Gerardin, P.J. Roussel, A. Ruzza, G. Meneghesso, A. Paccagnella, E. Simoen, and C. Claeys “A Statistical Approach to Microdose Induced Degradation in FinFET Devices”, 46th IEEE - Nuclear and Space Radiation Effects Conference - NSREC 2009.
    [25]    A. Griffoni, S. Gerardin, A. Ruzza, G. Meneghesso, A. Paccagnella, E. Simoen, and C. Claeys, “Angular and Strain Dependence of Heavy-Ions Induced Degradation in SOI FinFETs”, 10th European Conference on Radiation and Its Effects on Components and Systems - RADECS 2009.
    Submitted papers
    [26]    A. Griffoni, S. Gerardin, G. Meneghesso, A. Paccagnella, E. Simoen, S. Put, and C. Claeys, “Microdose and Breakdown Effects Induced by Heavy Ions on sub 32-nm Triple-Gate SOI FETs”, LNL Annual Report 2008.
    [27]        A. Griffoni, M. Silvestri, S. Gerardin, G. Meneghesso, A. Paccagnella, B. Kaczer, M. de Potter de ten Broeck, R. Verbeeck, and A. Nackaerts, “Dose Enhancement due to Interconnects in Deep-Submicron MOSFETs Exposed to X-Rays”, LNL Annual Report 2008.
     


    Registering is the only way of posting vacancies and obtaining contact details of candidates in our CV database.

    All it takes is a few minutes and a credit card (Visa or American Express). To sign-up to this service, simply click on the Register link and fill in the form. You will then have instant access to our system after on-line payment where you will be able to complete the transaction in either US Dollars, UK Pounds or Euros.

    All online credit/debit card transitions are handled through our secure third party payment processors at WorldPay. Worldpay are part of The Royal Bank of Scotland Group, the 5th biggest banking group in the world, WorldPay payment solutions are trusted by thousands of businesses, big and small worldwide. 

    Pricing starts at €450 (approx £400 or US$500 - use the convert tool for an exact conversion) for one month unlimited job postings and unlimited CV database access (for one user), with package discounts available if you have more permanent recruiting needs. For example, a Gold subscription will give you unlimited jobs posting and unlimited CV database access for one year at just over €250 per month!

     

    2018 Pricing Structure (excluding VAT):

    1 month - Discovery 450 euros convert
    3 months - Bronze 1150 euros convert
    6 months - Silver 1950 euros convert
    12 months - Gold 3200 euros convert

     

    If online payment is not convenient, give us a call at +33(0)622757477 or send us an email at sales@space-careers.com. We will set up an account for you and invoice you. Note that you can also pay through PayPal.

    Please note that the posting of academic positions is free of charge. All you need to do is email us your job description and we will post it for you.

     

    VAT:

    Spacelinks is based in France so the following European Union regulations regarding electronic commerce apply:
    - if your business is located outside the EU, VAT does not apply to you
    - if your business is located in France, you will be charged a 20% VAT
    - if your business is located in the EU and you don't have a valid VAT registration number, you will be charged a 20% VAT
    - if your business is located in the EU and you do have a valid VAT registration number, you won't be charged VAT provided you give us your VAT number (mandatory for invoicing)

     

    Support:

    For sales enquiries and general information, you can call us on +33(0)622757477.
    Support is available Mon-Fri on +33(0)622757477 or via email. Out-of-hours support is provided only via email.

    Please also note that we are located in France. Our normal office hours are 09:00 to 18:00 Monday to Friday. France timezone is GMT+1.

     

    Warning:

    We are very serious about our job seekers privacy so only legitimate recruiters and employers are eligible for a recruiter account. All subscriptions requests will be manually approved and recruiter accounts constantly monitored. Users who enter inaccurate or incomplete information will not gain access to post jobs or search resumes. Sharing of login details with a third party will result in the suspension of the recruiter's account with no subscription refund.
    Recruitment agencies are only eligible for a Gold package and recruitment agencies recruiting for companies already using Space Careers will not be accepted.

    To ensure you are approved, please include the following on your application:
    * The website address of your Company. Under construction websites will be rejected.
    * Email - Must end in @yourcompany.com. Applications using free email accounts such as Hotmail, Yahoo or Gmail will be rejected.

    Individual exceptions can be made on a case by case basis by emailing sales@space-careers.com. Accounts found not to be in compliance will be deleted.

     
    Terms & ConditionsCopyright ©2018 Spacelinks
    Web Analytics