Aerospace Engineer − Apr 2011 to present
Electrical Engineering and Flight Data Systems Division, code 561
NASA Goddard Space Flight Center, Greenbelt, MD 20771
Sr. Systems Engineer − Dec 2007 to Apr 2011
MEI Technologies Inc., c.o. NASA Goddard Space Flight Center, Greenbelt, MD 20771
· Radiation lead for the Joint Polar Satellite Systems program
§ Determined origins of on-orbit anomalies that lead to the implementation of mitigations for JPSS-1 and subsequent JPSS spacecrafts
§ Discovered and replaced several parts with weak radiation tolerance, leading to improvement of system reliability and mission assurance; one case lead to center-wide alert for the usage of the part in NASA projects
§ Provide expertise of radiation effects on electronic components, including total-ionizing dose, single-event effect, and displacement damage effect
§ Derived mission ionizing radiation environment specifications using simulation tools (SPENVIS, NOVICE, etc.)
§ Oversight of contractors and sub-contractors radiation assurance programs (four prime contractors and over 20 different sub-contractors)
§ Implement test guidelines and requirements
§ Manage team of test engineers and technicians for testing using heavy-ions, protons, pulsed-laser, and 60Co gamma rays
§ Calculate upset error rate using simulation tools such as Cosmic Ray Effects on Micro-Electronics(CRÈME-96)
§ Evaluate Worst Case Analysis
· Principal investigator of radiation reliability of non-volatile memories
§ Coauthor of NASA radiation test guideline of advanced non-volatile memories
§ Published first ever results of single-event effect performance of a production-level resistive memory
· Principal investigator of enhanced low dose rate sensitivity (ELDRS) project
§ Only project to comprehensively evaluate the ELDRS response of bipolar transistors and integrated circuit devices
§ Findings impacted the radiation assurance program of the community: ELDRS in bipolar transistors are now considered for part control programs
· Principal investigator of radiation performance of linear regulators and point-of-load regulators
§ Published first results of temperature effects on single-event transients in linear devices
§ Research findings and test results key to qualification of radiation-hardened products
· NASA performance award, 2012
· Outstanding conference paper award coauthor, “Mechanisms and Temperature Dependence of Single Event Latchup Observed in a CMOS Readout Integrated Circuit from 16 – 300 K,”2010 Nuclear Space Radiation Effects Conference (NSREC), Quebec City, Quebec, Canada
· Outstanding data workshop paper award coauthor, “Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA,” 2009, 2010, and 2011 NSREC
· Master of Science in Electrical Engineering– Aug 2005 to Dec 2007
Vanderbilt University, Nashville TN 37235
Thesis title – “Total Dose Irradiation Effects on Silicon and Germanium MOS Capacitors with Alternative Gate Dielectrics” (Advisor: Ronald Schrimpf)
· Bachelor of Engineering in Electrical Engineering and Mathematics– Aug 2001 to May 2005
Vanderbilt University, Nashville TN 37235
Keithley 4200 Parametric Analyzer, Agilent 4156 Parametric Analyzer, TRIAD TCII-1200IC and TCII-1333ST memory testers (DDR2/DDR3 and Flash IC chips and modules), 10 KeV ARACOR x-ray irradiator, KNS 4524AD digital wire bonder, Tektronics digital oscilloscope (various models)
§ Software/simulation tools:
CRÈME), Tanner S-edit, L-edit and T-spice (VLSI layout, schematic, and circuit simulation tools), TCAD (semiconductor device simulation tool), C++, LabVIEW
Journals and Conference Proceedings
§ D. Chen et al., “Evaluation of enhanced low dose rate sensitivity in discrete bipolar junction transistors,” 2012 Radiation Effects Data Workshop proceedings, pp. 1 – 7.
§ D. Chen et al., “Enhanced low dose rate sensitivity at ultra-low dose rates,” IEEE Trans. Nucl. Sci., vol. 58, no. 6, part 1, pp. 2983 - 2990, Dec. 2011.
§ T. Oldham et al., “Effect of Radiation Exposure on the Retention of Commercial NAND Flash Memory,” IEEE Trans. Nucl. Sci., vol. 58, no. 6, part 1, pp. 2904 - 2910, Dec. 2011.
§ D. Chen et al., “The effects of ELDRS at ultra-low dose rates,” 2010 Radiation Effects Data Workshop proceedings.
§ D. Chen et al., “Radiation performance of commercial SiGe HBT BiCMOS high speed operational amplifiers,” 2010 Radiation Effects Data Workshop proceedings.
§ C. Marshal et al., “Mechanisms and Temperature Dependence of Single Event Latchup Observed in a CMOS Readout Integrated Circuit from 16 – 300 K,” IEEE Trans. on Nucl. Sci., vol. 57, no. 6, pp. 3078 – 3086, Dec. 2010.
§ D. Chen et al., “The effects of elevated temperature on pulsed-laser-induced single event transients in analog devices,” IEEE Trans. on Nucl. Sci., vol. 56, no. 6, pp. 3138 – 3144, Dec. 2009.
§ M. O’Bryan et al., “Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems,” Radiation Effects Data Workshop proceedings, 2009, 2010, 2011, 2012, and 2013.
§ D. Cochran et al., “Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems,”Radiation Effects Data Workshop proceedings, 2009, 2010, 2011, 2012, and 2013.
§ D. Chen et al., “Total dose and bias temperature stress effects for HfSiON on Si MOS capacitors,” IEEE Tran. On Nucl Sci., vol. 54, no. 6, pp. 1931 – 1937, Dec. 2007.
§ D. Chen et al., “Total dose response of Ge MOS capacitors with HfO2/Dy2O3 gate stacks,” IEEE Trans. on Nucl. Sci., vol. 54, no. 4, pp. 971 – 974, Aug. 2007.
§ “Single-event effect performance of a commercial ReRAM,” to be presented at the Single-Event Effect Symposium and Military and Aerospace Programmable Logic Devices (MAPLD) Workshop, La Jolla, CA 2014.
§ “Functional interrupts and destructive failures from single-event testing of point-of-load devices,” presented at the Nuclear and Space Radiation Effects Conference, San Francisco, CA, July 2013.
§ “Radiation qualification of flash memories,” presented at the NASA Electronics Technology Workshop, June 11-12, 2013.
§ “Point-of-load devices for space,” presented at the NASA Electronics Technology Workshop, June 13, 2013.
§ “Enhanced low dose rate sensitivity at ultra-low dose rates,” presented at the Nuclear and Space Radiation Effects Conference, Las Vegas, NV, July 2011.
§ “The effects of elevated temperature on pulsed-laser-induced single event transients in analog devices,” presented at the Nuclear and Space Radiation Effects Conference, Quebec City, Quebec, July 2009.
§ ““Total dose and bias temperature stress effects for HfSiON on Si MOS capacitors,” presented at the Nuclear and Space Radiation Effects Conference, Honolulu, HI, July 2007.
Registering is the only way of posting vacancies and obtaining contact details of candidates in our CV database.
All it takes is a few minutes and a credit card (Visa or American Express). To sign-up to this service, simply click on the Register link and fill in the form. You will then have instant access to our system after on-line payment where you will be able to complete the transaction in either US Dollars, UK Pounds or Euros.
All online credit/debit card transitions are handled through our secure third party payment processors at WorldPay. Worldpay are part of The Royal Bank of Scotland Group, the 5th biggest banking group in the world, WorldPay payment solutions are trusted by thousands of businesses, big and small worldwide.
Pricing starts at €450 (approx £350 or US$500 - use the convert tool for an exact conversion) for one month unlimited job postings and unlimited CV database access (for one user), with package discounts available if you have more permanent recruiting needs. For example, a Gold subscription will give you unlimited jobs posting and unlimited CV database access for one year at just over €250 per month!
2017 Pricing Structure (excluding VAT):
|1 month - Discovery||450 euros||convert|
|3 months - Bronze||1150 euros||convert|
|6 months - Silver||1950 euros||convert|
|12 months - Gold||3200 euros||convert|
If online payment is not convenient, give us a call at +33(0)562211007 or send us an email at email@example.com. We will set up an account for you and invoice you. Note that you can also pay through PayPal.
Please note that the posting of academic positions is free of charge. All you need to do is email us your job description and we will post it for you.
Spacelinks is based in France so the following European Union regulations regarding electronic commerce apply:
- if your business is located outside the EU, VAT does not apply to you
- if your business is located in France, you will be charged a 20% VAT
- if your business is located in the EU and you don't have a valid VAT registration number, you will be charged a 20% VAT
- if your business is located in the EU and you do have a valid VAT registration number, you won't be charged VAT provided you give us your VAT number (mandatory for invoicing)
For sales enquiries and general information, you can call us on +33(0)562211007.
Support is available Mon-Fri on +33(0)562211007 or via email. Out-of-hours support is provided only via email.
Please also note that we are located in France. Our normal office hours are 09:00 to 18:00 Monday to Friday. France timezone is GMT+1.
We are very serious about our job seekers privacy so only legitimate recruiters and employers are eligible for a recruiter account. All subscriptions requests will be manually approved and recruiter accounts constantly monitored. Users who enter inaccurate or incomplete information will not gain access to post jobs or search resumes. Sharing of login details with a third party will result in the suspension of the recruiter's account with no subscription refund.
Recruitment agencies are only eligible for a Gold package and recruitment agencies recruiting for companies already using Space Careers will not be accepted.
To ensure you are approved, please include the following on your application:
* The website address of your Company. Under construction websites will be rejected.
* Email - Must end in @yourcompany.com. Applications using free email accounts such as Hotmail, Yahoo or Gmail will be rejected.
Individual exceptions can be made on a case by case basis by emailing firstname.lastname@example.org. Accounts found not to be in compliance will be deleted.